Deinstallation, Relocation, Reinstallation, Commissioning of DualBeam-FIB-SEM-Systems-Opex - PR1262394-3220-P
Fraunhofer-Gesellschaft - Einkauf B12
Requests to participate by 27 Nov 2026Notice summary
Deinstallation, relocation to a new location, reinstallation, reconnection (Re-Hook-up), commissioning, calibration, and performance acceptance of an existing DualBeam-FIB-SEM/FIB-REM system (Focused Ion Beam - Scanning Electron Microscope), manufacturer TESCAN GmbH, model GAIA3 GMH or GAIA3GMH, first installation 2018. Included are the existing system components, particularly Kleindiek micromanipulator, Oxford EDX detector, and TOFWERK TOF-SIMS. The scope of services also in…
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